Advanced XRF precision for reliable Coating Thickness analysis.
Maxsell’s P1 and P3 EDXRF Coating Thickness Analyzers are advanced XRF spectrometers designed to meet the diverse needs of industries requiring precise and reliable coating thickness analysis. Our XRF spectrometers are engineered to deliver fast, stable, and accurate results, ensuring that your coating processes adhere to the highest standards of quality and efficiency, yet are Competitively priced.
Maxsell P1 & P3 streamlines your workflow by simultaneously detecting coating thickness and composition without the need for standard samples.
The P1 supports up to four layers of coating detection, while the P3 is capable of detecting up to 10 layers, providing comprehensive analysis for various applications.
The P1 offers a measurement limit of 5nm for thickness and 5ppm for composition, with a precision of RSD±2.5%. The P3 further enhances precision, achieving measurement limits of 1nm for thickness and 2ppm for composition with RSD±1.5%.
Both analyzers adhere to global standards such as ISO3497:2000, GB/T16921, and ASTM-B568, ensuring that your processes meet regulatory requirements.
Maxsell P1 & P3 streamlines your workflow by simultaneously detecting coating thickness and composition without the need for standard samples.
| Feature | P1 | P3 |
|---|---|---|
| Analysis Elements | K(No.19) ~ U(No.92) | Al(No.13) ~ U(No.92) |
| Layers of Detection | Up to 4 layers | Up to 10 layers |
| Simultaneous Thickness & Composition Analysis | Yes | Yes |
| Measure Limit (Thickness) | 5nm | 1nm |
| Measure Limit (Composition) | 5ppm | 2ppm |
| Test Precision (Thickness) | RSD ± 2.5% | RSD ± 1.5% |
| Test Precision (Composition) | N/A | ±0.01% |
| Standards Compliance | ISO3497:2000, GB/T16921, ASTM-B568 | ISO3497:2000, GB/T16921, ASTM-B568 |
| XY Plane Micro Motion Platform | Stroke: 30mm * 30mm | Stroke: 30mm * 30mm |
| Observation | Lead glass for easy observation | Lead glass for easy observation |
| Collimators & Filters | Optional Collimators | Multi Collimators and Multi Filters |
| API Interface | Customized TCP/IP protocol, supports external network control status monitoring and data collection | Customized TCP/IP protocol, supports external network control status monitoring and data collection |
| Specification | P1 | P3 |
|---|---|---|
| Detection Limit (Thickness) | 5nm | 1nm |
| Detection Limit (Composition) | 5ppm | 2ppm |
| Precision | RSD±2.5% | RSD±1.5% |
| Layers Detected | Up to 4 | Up to 10 |
| Processor | Intel i3 dual-core | Intel i5 quad-core |
| Compliance | ISO3497:2000, GB/T16921, ASTM-B568 | ISO3497:2000, GB/T16921, ASTM-B568 |
| X-ray Tube | 50KV/1mA | 50KV/1mA |
| Weight | 43 kg | 44 kg |
| Dimensions | 500mm x 400mm x 368mm | 500mm x 400mm x 368mm |
| Power Supply | AC 100–240V, 50Hz | AC 100–240V, 50Hz |
| Noise Level | 50dB | 50dB |
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